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Layout-driven test-architecture design and optimization for 3D SoCs under pre-bond test-pin-count constraint.

Li JiangQiang XuKrishnendu ChakrabartyT. M. Mak
Published in: ICCAD (2009)
Keyphrases
  • global optimization
  • data sets
  • test data
  • neural network
  • information systems
  • feature selection
  • decision trees
  • data structure
  • cost function
  • data driven