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Layout-driven test-architecture design and optimization for 3D SoCs under pre-bond test-pin-count constraint.
Li Jiang
Qiang Xu
Krishnendu Chakrabarty
T. M. Mak
Published in:
ICCAD (2009)
Keyphrases
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global optimization
data sets
test data
neural network
information systems
feature selection
decision trees
data structure
cost function
data driven