Edge-Coupled Active and Passive Wafer-Scale Measurements on 300mm Silicon Photonics Wafers.
Kenneth M. JabonChristopher V. PoultonRen-Jye ShiueMatthew J. ByrdZhan SuMohammad H. TeimourpourScott BreitensteinRonald P. MillmanDogan A. AtlasMichael R. WattsErman TimurdoganPublished in: OFC (2021)