SINGLE SCALE
Experts
- Tony Lindeberg
- Theo Gevers
- Joost van de Weijer
- Baowei Lin
- Yashar Mehmani
- Noureddine Ellouze
- Yu-Ping Wang
- Zixiang Xiong
- Akira Taguchi
- Hamdi A. Tchelepi
- Alan C. Bovik
- Raimondo Schettini
- Simone Bianco
- Jae Ho Jang
- Arjan Gijsenij
- Jong Beom Ra
- Kenneth R. Castleman
- Vicent Caselles
- Ylva Jansson
- Qiang Wu
- Witold Kinsner
- Yiming Pi
- Ivan Viola
- Dan Wu
- Huizhong Chen
- Shigeru Muraki
- Sergio Cerutti
- Gabriele Facciolo
- Juan Galvis
- Sung Deuk Kim
- Wenjun Zhang
- Ick Hoon Jang
- Tsung-Yi Lin
- Günter Herrmann
- William J. Kaiser
- Bülent Sankur
- Abdelmalik Ouamane
- Denny Zhou
- Fei Wang
Venues
- CoRR
- ICIP
- ICASSP
- IEEE Trans. Image Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Signal Process.
- IEEE Access
- Multim. Tools Appl.
- CVPR
- Pattern Recognit. Lett.
- ICPR
- IET Image Process.
- J. Math. Imaging Vis.
- IEEE Trans. Geosci. Remote. Sens.
- Remote. Sens.
- IEEE Trans. Biomed. Eng.
- IEEE Trans. Medical Imaging
- Pattern Recognit.
- J. Comput. Phys.
- IEEE Signal Process. Lett.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- Entropy
- Multiscale Model. Simul.
- EUSIPCO
- IEEE Trans. Vis. Comput. Graph.
- J. Electronic Imaging
- ICIP (3)
- IEEE Trans. Signal Process.
- ICCV
- IGARSS
- Image Vis. Comput.
- Scale-Space
- ICIP (1)
- Vis. Comput.
- ICIP (2)
- Color Imaging Conference
- IEEE Trans. Consumer Electron.
- Signal Image Video Process.
- EMBC
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