SINGLE SCALE
Experts
- Tony Lindeberg
- Theo Gevers
- Joost van de Weijer
- Kenneth R. Castleman
- Akira Taguchi
- Jae Ho Jang
- Noureddine Ellouze
- Ylva Jansson
- Vicent Caselles
- Hamdi A. Tchelepi
- Witold Kinsner
- Qiang Wu
- Arjan Gijsenij
- Alan C. Bovik
- Raimondo Schettini
- Zixiang Xiong
- Yashar Mehmani
- Baowei Lin
- Yu-Ping Wang
- Jong Beom Ra
- Simone Bianco
- Stéphane Mallat
- Chang Su
- Md. Arifur Rahman
- Lucas Beyer
- Sergio Cerutti
- San Chi Liu
- Haichao Miao
- Anne Humeau-Heurtier
- Yiming Pi
- Yi-Fei Pu
- Jan Kautz
- Günter Herrmann
- Xiaodan Song
- Taeil Hur
- Shigeru Muraki
- Yuanzhi Cai
- Nam Chul Kim
- Rui J. P. de Figueiredo
Venues
- CoRR
- ICIP
- ICASSP
- IEEE Trans. Image Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Access
- Signal Process.
- Multim. Tools Appl.
- Pattern Recognit. Lett.
- CVPR
- ICPR
- IET Image Process.
- IEEE Trans. Geosci. Remote. Sens.
- J. Math. Imaging Vis.
- Remote. Sens.
- Multiscale Model. Simul.
- ICIP (3)
- J. Electronic Imaging
- EUSIPCO
- IEEE Signal Process. Lett.
- IEEE Trans. Biomed. Eng.
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- Pattern Recognit.
- IEEE Trans. Vis. Comput. Graph.
- IEEE Trans. Medical Imaging
- J. Comput. Phys.
- Entropy
- IEEE Trans. Signal Process.
- Image Vis. Comput.
- ICIP (1)
- Scale-Space
- ICCV
- IGARSS
- Color Imaging Conference
- EMBC
- Sensors
- Vis. Comput.
- IEEE Trans. Consumer Electron.
- ICIP (2)
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