SINGLE SCALE
Experts
- Tony Lindeberg
- Theo Gevers
- Joost van de Weijer
- Simone Bianco
- Zixiang Xiong
- Witold Kinsner
- Arjan Gijsenij
- Baowei Lin
- Akira Taguchi
- Yu-Ping Wang
- Noureddine Ellouze
- Hamdi A. Tchelepi
- Raimondo Schettini
- Jae Ho Jang
- Alan C. Bovik
- Kenneth R. Castleman
- Yashar Mehmani
- Jong Beom Ra
- Qiang Wu
- Ylva Jansson
- Vicent Caselles
- Wenjun Zhang
- Dan Wu
- Gabriele Facciolo
- Nicolai Petkov
- Chang Su
- Carlos Segura
- Joel Sole
- Jan Kautz
- Zhi-Yan Xie
- Sarah Brockman
- Jun Zhu
- Guoying Zhang
- Ken Perlin
- Samuel W. Hasinoff
- Zia-ur Rahman
- Kazufumi Kaneda
- William J. Kaiser
- Taeil Hur
Venues
- CoRR
- ICIP
- ICASSP
- IEEE Trans. Image Process.
- IEEE Trans. Pattern Anal. Mach. Intell.
- Signal Process.
- IEEE Access
- CVPR
- Multim. Tools Appl.
- Pattern Recognit. Lett.
- IET Image Process.
- ICPR
- J. Math. Imaging Vis.
- Remote. Sens.
- IEEE Trans. Geosci. Remote. Sens.
- J. Comput. Phys.
- ICIP (3)
- Entropy
- J. Electronic Imaging
- Multiscale Model. Simul.
- IEEE Trans. Biomed. Eng.
- IEEE Signal Process. Lett.
- IEEE Trans. Medical Imaging
- IEEE J. Sel. Top. Appl. Earth Obs. Remote. Sens.
- IEEE Trans. Vis. Comput. Graph.
- Pattern Recognit.
- EUSIPCO
- ICCV
- Scale-Space
- ICIP (1)
- IEEE Trans. Signal Process.
- IGARSS
- Image Vis. Comput.
- Neural Networks
- IEEE Trans. Consumer Electron.
- Color Imaging Conference
- Signal Image Video Process.
- ICIP (2)
- EMBC
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