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A framework and method for hierarchical test generation.

John D. CalhounFranc Brglez
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (1992)
Keyphrases
  • main contribution
  • detection method
  • test generation
  • real world
  • similarity measure
  • probabilistic model
  • database
  • data sets
  • machine learning
  • test cases