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Electron Tomography of Macromolecular Assemblies.

Hanspeter WinklerJun LiuKenneth A. TaylorPing ZhuKenneth H. Roux
Published in: ISBI (2007)
Keyphrases
  • electron microscope
  • x ray
  • three dimensional
  • noise level
  • image reconstruction
  • electron microscopy
  • database
  • data sets
  • electron beam
  • metal oxide
  • neural network
  • decision making
  • noisy images
  • limited angle
  • van der waals