Compressive Binary Patterns: Designing a Robust Binary Face Descriptor with Random-Field Eigenfilters.
Weihong DengJiani HuJun GuoPublished in: IEEE Trans. Pattern Anal. Mach. Intell. (2019)
Keyphrases
- random fields
- binary patterns
- markov random field
- feature descriptors
- maximum entropy
- local binary pattern
- face recognition
- binary images
- conditional random fields
- face images
- shift invariant
- gray level
- non stationary
- object recognition
- keypoints
- probabilistic model
- hidden markov models
- gray scale
- image features
- shape descriptors
- computer vision