Parameter Identification for Semiconductor Diodes by LBIC Imaging.

David A. Redfern Kazufumi Ito Weifu Fang

Published in: SIAM J. Appl. Math. (2002)

Keyphrases

parameter identification
closed loop
semiconductor devices
fuzzy model
autoregressive
flight test
image processing
image analysis
chaotic systems
high resolution
pattern recognition
control system
high density
decision making
high alpha research vehicle