Testable Realizations for FET Stuck-Open Faults CMOS Combinational Logic Circuits.

Sudhakar M. Reddy Madhukar K. Reddy

Published in: IEEE Trans. Computers (1986)

Keyphrases

logic circuits
low power
power consumption
low cost
high speed
power dissipation
functional decomposition
fault diagnosis
chip design
cmos technology
tunnel diode
logic synthesis
digital signal processing
model based diagnosis
image sensor
fault detection
random variables
analog vlsi
image restoration