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Automated Generation of Built-In Self-Test and Measurement Circuitry for Mixed-Signal Circuits and Systems.

George J. StarrJie QinBradley F. DuttonCharles E. StroudFoster F. DaiVictor P. Nelson
Published in: DFT (2009)
Keyphrases
  • vlsi circuits
  • circuit design
  • genetic algorithm
  • digital circuits
  • mixed signal
  • built in self test
  • constraint satisfaction problems
  • complex systems