An efficient BIST method for testing of embedded SRAMs.
Mohammad H. TehranipourZainalabedin NavabiSeid Mehdi FakhraiePublished in: ISCAS (5) (2001)
Keyphrases
- computational cost
- test data
- high accuracy
- prior knowledge
- preprocessing
- objective function
- cost function
- experimental evaluation
- training data
- main contribution
- clustering method
- synthetic data
- segmentation method
- image segmentation
- embedded systems
- computer vision
- fully automatic
- high precision
- classification method
- computationally efficient