Specification-based Verification of Embedded Systems by Automated Test Case Generation.
Christoph M. KirchsteigerChristoph TrummerChristian StegerReinhold WeissMarkus PistauerPublished in: DIPES (2008)
Keyphrases
- embedded systems
- test case generation
- test cases
- software testing
- object oriented systems
- low cost
- software systems
- test data generation
- embedded devices
- computing power
- resource limited
- embedded software
- real time systems
- test suite
- test generation
- embedded real time systems
- model checking
- field programmable gate array
- hw sw
- hardware software
- java programs
- consumer electronics
- source code
- object oriented
- real time
- protocol stack
- distributed systems
- relational databases
- cooperative
- software development
- high level
- flash memory
- error rate
- test set