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Sequential circuit test generation using dynamic state traversal.

Michael S. HsiaoElizabeth M. RudnickJanak H. Patel
Published in: ED&TC (1997)
Keyphrases
  • test generation
  • quality assurance
  • design automation
  • real world
  • data structure
  • high speed
  • test cases
  • static analysis
  • data sets
  • artificial intelligence
  • high quality
  • multi agent