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SRAM Voltage and Current Sense Amplifiers in sub-32nm Double-gate CMOS Insensitive to Process Variations and Transistor Mismatch.
Piotr Nasalski
Adam Makosiej
Bastien Giraud
Andrei Vladimirescu
Amara Amara
Published in:
ISCAS (2009)
Keyphrases
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low voltage
leakage current
cmos technology
low power
power line
high speed
design considerations
random access memory
power consumption
nm technology
power management
low cost
neural network
electrical properties
metal oxide
high power
single phase
power dissipation