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Reliability Modeling and Management of Nanophotonic On-Chip Networks.

Zheng LiMoustafa MohamedXi ChenEric DudleyKe MengLi ShangAlan Rolf MickelsonRuss JosephManish VachharajaniBrian SchwartzYihe Sun
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2012)
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