Energy-reliability limits in nanoscale circuits.
Avhishek ChatterjeeLav R. VarshneyPublished in: ITA (2016)
Keyphrases
- energy consumption
- total energy
- power distribution systems
- reliability analysis
- high speed
- energy minimization
- energy efficiency
- minimum energy
- solar energy
- vlsi circuits
- analog circuits
- data sets
- real time
- e learning
- information retrieval
- mechanical properties
- data mining
- analog vlsi
- real world
- neural network
- tunnel diode
- atomic force microscopy