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Pseudomorphic high electron mobility transistor monolithic microwave integrated circuits reliability study.
Wallace T. Anderson
Jason A. Roussos
Jeffrey A. Mittereder
Dimitrios E. Ioannou
C. Moglestue
Published in:
Microelectron. Reliab. (2001)
Keyphrases
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integrated circuit
electron beam
wide range
statistical analysis
real time
image processing
case study
control system
theoretical framework
quality control