Jason A. Roussos

Publication Activity (10 Years)

Years Active: 2001-2002
Publications (10 Years): 0

Publications

Jeffrey A. Mittereder, Jason A. Roussos, Wallace T. Anderson, Dimitrios E. Ioannou
Quantitative measurement of channel temperature of GaAs devices for reliable life-time prediction. IEEE Trans. Reliab. 51 (4) (2002)
Wallace T. Anderson, Jason A. Roussos, Jeffrey A. Mittereder, Dimitrios E. Ioannou, C. Moglestue
Pseudomorphic high electron mobility transistor monolithic microwave integrated circuits reliability study. Microelectron. Reliab. 41 (8) (2001)