Quantitative measurement of channel temperature of GaAs devices for reliable life-time prediction.
Jeffrey A. MitterederJason A. RoussosWallace T. AndersonDimitrios E. IoannouPublished in: IEEE Trans. Reliab. (2002)
Keyphrases
- room temperature
- prediction accuracy
- solar radiation
- air temperature
- quantitative and qualitative
- prediction model
- mobile applications
- prediction error
- multi channel
- prediction algorithm
- relative humidity
- mobile devices
- field effect transistors
- light emitting
- qualitative and quantitative
- single channel
- end to end
- high temperature
- short term