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High-voltage nLDMOS Drain Side Schottky/SCR Modulations for Enhancement Reliability Capabilities.
Ting-En Lin
Shen-Li Chen
Zhi-Wei Liu
Xing-Chen Mai
Xiu-Yuan Yang
Yu-Jie Chung
Published in:
ICCE-Taiwan (2023)
Keyphrases
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high voltage
operating conditions
normal operation
partial discharge
image processing
image enhancement
high density
machine learning
artificial intelligence
high dimensional
artificial neural networks
fault diagnosis
design methodology