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source/drain NT JLFET for enhanced hot carrier reliability with temperature measurement.

Anchal ThakurRohit Dhiman
Published in: Microelectron. J. (2022)
Keyphrases
  • data acquisition
  • software reliability
  • database
  • machine learning
  • genetic algorithm
  • case study
  • database systems
  • training data
  • hidden markov models
  • decision support system
  • failure rate
  • reliability analysis