Using a hierarchical DfT methodology in high frequency processor designs for improved delay fault testability.
Michael KesslerGundolf KieferJens LeenstraKnut SchünemannThomas SchwarzHans-Joachim WunderlichPublished in: ITC (2001)
Keyphrases
- blocking artifacts
- high frequency
- low frequency
- high resolution
- visual quality
- subband
- high frequency components
- wavelet transform
- wavelet coefficients
- frequency band
- fault diagnosis
- frequency domain
- wavelet decomposition
- high speed
- high frequencies
- multi resolution analysis
- discrete wavelet transform
- low pass
- fourier transform
- power supply
- image processing
- super resolution
- image compression
- feature extraction