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Metal-Oxide RRAM.

H.-S. Philip WongHeng-Yuan LeeShimeng YuYu-Sheng ChenYi WuPang-Shiu ChenByoungil LeeFrederick T. ChenMing-Jinn Tsai
Published in: Proc. IEEE (2012)
Keyphrases
  • metal oxide
  • x ray
  • solid state
  • high speed
  • real time
  • databases
  • three dimensional
  • si sio
  • query processing
  • random access