Fabrication Defects and Fault Models for DNA Self-Assembled Nanoelectronics.

Vincent Mao Chris Dwyer Krishnendu Chakrabarty

Published in: ITC (2008)

Keyphrases

fault models
model based diagnosis
thin film transistor
fault management
high density
fault model
dna sequences
integrated circuit
liquid crystal displays
horn clauses
conflict resolution
network management
dynamic systems
printed circuit boards
artificial intelligence
logic programs