The State-of-Art and Future Trends in Testing Embedded Memories.

Said Hamdioui Georgi Gaydadjiev Ad J. van de Goor

Published in: MTDT (2004)

Keyphrases

future trends
open issues
mobile communications
data mining
embedded systems
artificial intelligence
test data
recent trends
real time
real world
expert systems
test set
test cases
software testing
multimodal interfaces