Login / Signup
How Circuit Analysis and Yield Optimization Can Be Used To Detect Circuit Limitations Before Silicon Results.
Carlo Roma
Pierluigi Daglio
Guido De Sandre
Marco Pasotti
Marco Poles
Published in:
ISQED (2005)
Keyphrases
</>
high speed
electronic circuits
semiconductor devices
data analysis
analog circuits
image analysis
circuit design
digital circuits
high density
duty cycle
analog vlsi
low voltage
logic circuits
real time
low power
detection method
multi objective
case study
image processing