Neural Network Approach for Multiple Fault Test of Digital Circuit.

Pan Zhongliang Chen Ling Liu Shouqiang Guangzhao Zhang

Published in: ISDA (3) (2006)

Keyphrases

neural network
digital circuits
fault diagnosis
artificial neural networks
analog circuits
genetic algorithm
learning vector quantization
fuzzy artmap
database
evolvable hardware
circuit design
fault detection
data flow
associative memory
prediction model
self organizing maps
back propagation
pattern recognition