COMPACTEST: A Method to Generate Compact Test Sets for Combinatorial Circuits.
Irith PomeranzLakshmi N. ReddySudhakar M. ReddyPublished in: ITC (1991)
Keyphrases
- test set
- generation method
- preprocessing
- test data
- significant improvement
- cost function
- error rate
- high accuracy
- high precision
- synthetic data
- upper bound
- feature set
- classification accuracy
- segmentation method
- pairwise
- similarity measure
- high speed
- probabilistic model
- experimental evaluation
- classification method
- computational complexity
- evaluation methodology
- support vector