Login / Signup

Test Pattern Modification for Average IR-Drop Reduction.

Wei-Sheng DingHung-Yi HsiehCheng-Yu HanJames Chien-Mo LiXiaoqing Wen
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2016)
Keyphrases
  • association rules
  • information retrieval
  • information retrieval systems
  • pattern discovery
  • data sets
  • databases
  • digital libraries
  • test data
  • standard deviation