Low-Cost ATE PinElectronics for Multigigabit-per-Second At-Speed Test.

David C. Keezer R. J. Wenzel

Published in: ITC (1997)

Keyphrases

low cost
low power
high speed
real time
statistical tests
neural network
information retrieval
e learning
expert systems
highly efficient
hardware and software
digital camera
test data
wide range
multi agent
image sequences
databases