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A CPW Resonator for Complex Dielectric Characterization of Thin Films at W-Band.

Abdelhamid M. H. NasrKamal Sarabandi
Published in: IEEE Trans. Instrum. Meas. (2024)
Keyphrases
  • thin film
  • chemical vapor deposition
  • high density
  • dielectric constant
  • low cost
  • high frequency
  • grain size
  • dual band
  • short circuit