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Yield-Based Capability Index for Evaluating the Performance of Multivariate Manufacturing Process.
Kai Gu
Xinzhang Jia
Hongwei Liu
Hailong You
Published in:
Qual. Reliab. Eng. Int. (2015)
Keyphrases
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manufacturing process
quality control
process control
manufacturing systems
product design
control system
discrete event
product quality
database
printed circuit boards
expert systems
process planning
database systems
information technology
surface roughness