A Method of Static Test Compaction Based on Don't Care Identification.
Kohei MiyaseSeiji KajiharaSudhakar M. ReddyPublished in: DELTA (2002)
Keyphrases
- high accuracy
- experimental evaluation
- preprocessing
- similarity measure
- artificial neural networks
- long term
- statistical significance
- high precision
- test data
- error rate
- computational cost
- cost function
- support vector machine
- mutual information
- computationally efficient
- main contribution
- optimization algorithm
- detection method
- pairwise
- computational complexity
- fully automatic
- multiscale