Reducing Post-Silicon Coverage Monitoring Overhead with Emulation and Bayesian Feature Selection.
Ricardo Ochoa GallardoAlan J. HuAndré IvanovMaryam S. MirianPublished in: ICCAD (2015)
Keyphrases
- unsupervised learning
- feature selection
- text classification
- machine learning
- monitoring system
- mutual information
- real time
- text categorization
- high density
- high speed
- model selection
- automatic relevance determination
- bayesian learning
- feature selection algorithms
- posterior distribution
- decision support
- maximum likelihood
- low cost
- support vector machine
- data driven
- feature set
- high dimensionality
- posterior probability
- feature subset
- multi class
- classification accuracy
- selected features
- bayesian networks
- small samples
- early warning
- support vector
- feature weighting
- bayesian methods
- information gain
- classification models
- feature extraction