µTIL: Mutation-based Statistical Test Inputs Generation for Automatic Fault Localization.
Mickaël DelahayeLionel C. BriandArnaud GotliebMatthieu PetitPublished in: SERE (2012)
Keyphrases
- statistical tests
- fault localization
- dea models
- hypothesis test
- statistically significant
- statistical analysis
- model based diagnosis
- program understanding
- hypothesis testing
- genetic algorithm
- statistical significance
- data abstraction
- sample size
- fault detection
- statistical methods
- programming language
- software testing
- neural network
- database
- database systems
- decision trees
- information systems
- databases