Built-In Test of RF Components Using Mapped Feature Extraction Sensors.
Selim Sermet AkbayAbhijit ChatterjeePublished in: VTS (2005)
Keyphrases
- feature extraction
- sensor networks
- image processing
- relevance feedback
- image classification
- face recognition
- wavelet transform
- sensor data
- real time
- feature selection
- defect detection
- linear discriminant analysis
- machine learning
- sensor technology
- feature extraction and classification
- multi sensor
- frequency domain
- test data
- texture analysis
- manifold learning
- extracted features
- radio frequency
- dimensionality reduction
- image sequences
- computer vision
- signal strength