Verification and test system technology for CMOS-MEMS switches.

Liu Peng Wenzhong Lou Ximing Dai Yufei Lu

Published in: NEMS (2015)

Keyphrases

power consumption
test generation
rapid development
cost effective
cmos technology
low cost
high speed
data sets
case study
technological advances
data processing
computer systems
test cases
model checking
website
key technologies
st century
face verification
e learning
genetic algorithm