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Simultaneous reduction in test data volume and test time for TRC-reseeding.

Bin ZhouYizheng YeYongsheng Wang
Published in: ACM Great Lakes Symposium on VLSI (2007)
Keyphrases
  • test data
  • test cases
  • test set
  • training data
  • training set
  • data sets
  • database
  • training and test data
  • search based testing
  • databases
  • support vector