Soft error masking latch for sub-threshold voltage operation.
Yongsuk ChoiYong-Bin KimFabrizio LombardiPublished in: MWSCAS (2012)
Keyphrases
- minimum error
- power consumption
- error rate
- power system
- human visual system
- high density
- high voltage
- power supply
- threshold values
- squared error
- absolute error
- low power
- quantization error
- normal operation
- error detection
- just noticeable difference
- threshold selection
- electric field
- real time
- low cost
- multiscale
- data sets