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X-Masking for Deterministic In-System Tests.

Grzegorz MrugalskiJanusz RajskiJerzy TyszerBartosz Wlodarczak
Published in: IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. (2023)
Keyphrases
  • human visual system
  • black box
  • neural network
  • three dimensional
  • real world
  • decision making
  • image segmentation
  • bayesian networks
  • learning environment
  • test cases
  • randomized algorithms