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In situ measurement of aging-induced performance degradation in digital circuits.
Nasim Pour Aryan
Christian Funke
Jens Bargfrede
Cenk Yilmaz
Doris Schmitt-Landsiedel
Georg Georgakos
Published in:
ETS (2016)
Keyphrases
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digital circuits
data flow
evolvable hardware
finite state machines
model based diagnosis
circuit design
functional decomposition
age estimation
software aging
databases
search algorithm
computational complexity
data acquisition