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Radiation-Hardened 0.3-0.9-V Voltage-Scalable 14T SRAM and Peripheral Circuit in 28-nm Technology for Space Applications.
Yuanyuan Han
Xu Cheng
Jun Han
Xiaoyang Zeng
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2020)
Keyphrases
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nm technology
power consumption
low voltage
low power
power dissipation
power system
power management
duty cycle
x ray
infrared
low dimensional
power reduction
input output
relational databases
power supply
single phase
low cost
electronic circuits
query language