A Seal Imprint Verification with Rotation Invariance.
Takenobu MatsuuraKenta YamazakiPublished in: KES (4) (2005)
Keyphrases
- local binary pattern
- rotation invariance
- rotation invariant
- scale invariance
- scale and rotation invariant
- scale invariant
- texture analysis
- multiscale
- spatial information
- texture features
- zernike moments
- noise immunity
- shape context
- fourier transform
- signal processing
- moment invariants
- multiresolution
- pattern recognition
- three dimensional