Similarity-based Local Feature Extraction for Wafer Bin Map Pattern Recognition.
Jieun KimJun-Geol BaekPublished in: ICAIIC (2022)
Keyphrases
- feature extraction
- pattern recognition
- pattern classification
- image processing
- support vector machine svm
- image classification
- preprocessing
- maximum a posteriori
- face recognition
- feature vectors
- dimensionality reduction
- machine learning
- discriminant analysis
- signal processing
- wavelet transform
- neural network
- pattern analysis
- integrated circuit
- principal component analysis
- feature space
- pattern representation
- feature extraction and classification
- texture analysis
- feature fusion
- pattern recognition problems
- gabor filters
- parallel distributed processing
- field of pattern recognition
- massively parallel
- rough sets
- linear discriminant analysis
- extracted features
- texture classification
- semiconductor manufacturing
- computer vision
- feature selection
- fuzzy sets