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Compressing Functional Tests for Microprocessors.

Kedarnath J. BalakrishnanNur A. ToubaSrinivas Patil
Published in: Asian Test Symposium (2005)
Keyphrases
  • functional analysis
  • databases
  • personal computer
  • single chip
  • real time
  • e learning
  • website
  • multi agent systems
  • hidden markov models
  • test data
  • power consumption
  • computer architecture
  • instruction set