Silicon Proven 1.29 μm × 1.8 μm 65nm Sub-Vt Optical Sensor for Hardware Security Applications.
David ZookerYoav WeizmanAlexander FishOsnat KerenPublished in: IEEE Access (2023)
Keyphrases
- image sensor
- cmos technology
- metal oxide semiconductor
- low cost
- silicon on insulator
- sensor technology
- liquid crystal
- real time
- charge coupled device
- hardware and software
- electro optical
- dynamic range
- image capture
- imaging sensors
- transmission electron microscopy
- data acquisition
- random number generator
- solid state
- high speed
- low power
- digital camera
- video camera
- network security
- micro controller
- sensor data
- intrusion detection and prevention
- security policies
- high density
- image processing algorithms
- security requirements
- intrusion detection
- access control
- sensor networks
- wireless sensor
- security issues
- infrared
- computer systems
- rfid tags
- statistical databases
- information security