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On Test and Characterization of Analog Linear Time-Invariant Circuits Using Neural Networks.
Zhen Guo
Xi Min Zhang
Jacob Savir
Yun-Qing Shi
Published in:
Asian Test Symposium (2001)
Keyphrases
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neural network
analog vlsi
linear time invariant
analog circuits
circuit design
dynamic systems
artificial neural networks
floating gate
machine learning
multiresolution
fuzzy logic
digital circuits
built in self test
mixed signal