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Overcoming Limited Fault Data: Intermittent Fault Detection in Analog Circuits via Improved GAN.
Xiaoyu Fang
Jianfeng Qu
Bowen Liu
Yi Chai
Published in:
IEEE Trans. Instrum. Meas. (2024)
Keyphrases
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fault detection
fault diagnosis
data analysis
analog circuits
historical data
neural network
real time
data sources
tennessee eastman
failure detection
fault localization
complex systems
case based reasoning
management system
knowledge discovery
artificial neural networks
artificial intelligence
machine learning