GC-eDRAM with Body-Bias Compensated Readout and Error Detection in 28nm FD-SOI.

Robert Giterman Andrea Bonetti Andreas Burg Adam Teman

Published in: ISCAS (2020)

Keyphrases

error detection
error correction
silicon on insulator
error recovery
fault tolerance
data cleansing
error correcting
error resilient
human body
fault isolation
error control
fault tolerant
sensor networks
complex systems
data conversion