Built-in Self-Test for State Faults Induced by Crosstalk in Sequential Circuits.

Kazuya Shimizu Noriyoshi Itazaki Kozo Kinoshita

Published in: Asian Test Symposium (2001)

Keyphrases

built in self test
integrated circuit
high speed
artificial intelligence
data sets
real world
machine learning
website
reinforcement learning
evolutionary algorithm
fault detection