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ADC/DAC Loopback Linearity Testing by DAC Output Offsetting and Scaling.
Xuan-Lun Huang
Jiun-Lang Huang
Published in:
IEEE Trans. Very Large Scale Integr. Syst. (2011)
Keyphrases
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max csp
input data
database
data sets
data mining
computer vision
decision trees
infrared
test data
rbf network