ADC/DAC Loopback Linearity Testing by DAC Output Offsetting and Scaling.

Xuan-Lun Huang Jiun-Lang Huang

Published in: IEEE Trans. Very Large Scale Integr. Syst. (2011)

Keyphrases

max csp
input data
database

data sets
data mining
computer vision

decision trees
infrared

test data
rbf network