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ADC/DAC Loopback Linearity Testing by DAC Output Offsetting and Scaling.

Xuan-Lun HuangJiun-Lang Huang
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2011)
Keyphrases
  • max csp
  • input data
  • database
  • data sets
  • data mining
  • computer vision
  • decision trees
  • infrared
  • test data
  • rbf network